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Need Way to quickly compare many transistor measurements
ISTFA 2006, Nano-probing Application on Characterization of 6T-SRAM Single Bit Failures with Different Gox Breakdown Defect
Cheng-Piao Lin, et al TSMC Taiwan
ISTFA 2014, Utilizing Nanoprobing and Circuit Diagnostics to Identify Key Failure Mechanism of Otherwise Non-Visible Defects in 20nm
M. K. Dawood, et al, GLOBALFOUNDRIES Singapore Pte. Ltd. Singapore
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ISTFA 2013, SEM-based nanoprobing on 40, 32 and 28nm CMOS devices Challenges for Semiconductor Failure Analysis
Erik Paul, et al, GLOBALFOUNDRIES Dresden, Germany
Nanoprobing Charts