ը૾ݕࠪ ੑೳݕࠪ ྑճऩ ͕ߦΘΕΔɽ [1] Okazaki, S., Shirafuji, S., Yasui, T., & Ota, J. (2023, June). A Framework to Support Failure Cause IdenIficaIon in Manufacturing Systems through GeneralizaIon of Past FMEAs. In 2023 IEEE/ASME InternaIonal Conference on Advanced Intelligent Mechatronics (AIM) (pp. 858-865). IEEE. 図1. 生産ラインの例 [1] 1
ԿΛใࠂ͖͔͢ ΛఆٛɾମܥԽ͢Δ 図3. オントロジーを中心とした監視・報告フレームワーク [3] 図4. 監視・報告のためのオントロジー [3] [3] Del Amo, I. F., Erkoyuncu, J. A., Bułka, D., Farsi, M., Ariansyah, D., Khan, S., & Wilding, S. (2024). Advancing fault diagnosis through ontology-based knowledge capture and applicaIon. IEEE Access, 12, 144599-144620. 4
[4] Fujiu, T., Yasui, T., Okazaki, S., Kaminishi, K., & Ota, J. (2024, July). DescripIon Method and Failure Ontology for UIlizing Maintenance Logs with FMEA in Failure Cause Inference of Manufacturing Systems. In 2024 IEEE InternaIonal Conference on Advanced Intelligent Mechatronics (AIM) (pp. 512-517). IEEE. 6