GDE Reduce hardware costs • Design: Use commodity parts • Supply chain: Volume purchasing, negotiation, 30-90 day terms • Cheap to assemble (30% cost from assembly) • Low failure rate
SQL GDE Stats of all the tests SELECT test_name, alias, result, COUNT(result) AS number, type AS units, MIN(value) AS min, NTH(5, QUANTILES(value ,101)) fifth, AVG(value) AS avg, NTH(50, QUANTILES(value ,101)) median, NTH(95, QUANTILES(value ,101)) ninety_fifth, MAX(value) AS max FROM [MANUFACTURE.pcba_test_results_flattened] GROUP BY test_name, alias, result, units ORDER BY number DESC
GDE Vsys (3V3) test_name result numberunits min fifth avg median ninety_fifth max test_VSYS P A S S 512 VoltageDC 3.281589 3.287578 3.297513 3.297278 3.307268 3.317785 test_VSYS FAIL 39 VoltageDC -0.00198 -0.00163 0.065324 0.075967 0.082376 0.082787 % Error -0.56% -0.38% -0.08% -0.08% 0.22% 0.54%
R GDE Shift in production process > t.test(r32$old, r32$new) Welch Two Sample t-test data: r32$old and r32$new t = -25.459, df = 40.49, p-value < 2.2e-16 alternative hypothesis: true difference in means is not equal to 0 95 percent confidence interval: -78.96871 -67.35696 sample estimates: mean of x mean of y 9929.666 10002.829