Eact e kBT 1 = 0 e 0.4eV kBT 1e-05 0.0001 0.001 0.01 0.1 1300 1000 800 700 600 500 Inverse of Temperature (K-1) Migration is temperature dependent ln[(s!)p(t/τ,s)] = s ln(t/τ) − t/τ. (10) s are obtained for all three temperatures, conﬁrming tion that point defect migration follows a Poisson ig. 17). The jump rates for each temperature, y ﬁtting, are plotted in Fig. 16(b) as ﬁlled gray h uncertainties corresponding to the error in the es ﬁt. The gray line is the least-squares ﬁt of Eq. (8) obtained from MD. The activation energy obtained MC model (Eact eff = 0.398 ± 0.002 eV) is well within nty of the activation energy found by ﬁtting the MD y, Eact eff = 0.374 ± 0.045 eV. ctive attempt frequency for defect migration ob- ﬁtting the MD data is ν0 = 6.658 × 109 ± 2.7 × is value is several orders of magnitude lower than mpt frequencies for point defect migration in fcc , 1012−1014 s−1.72–74 A mechanistic interpretation ow migration attempt frequency is not immediately g. One possible explanation is that it arises from number of atoms participating in the migration • Migration rates are reduced because there are multiple paths • Transition state theory may be revised to explain reduced migration rates K. Kolluri and M. J. Demkowicz, Phys Rev B, 85, 205416 (2012)